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Proceedings : microscopy and microanalysis 2002 : Microscopy Society of America, 60th annual meeting, Microbeam analysis Society, 36th annual meeting, Microscopy Society of Canada, 29th annual meeting, International Metallographic Society, 35th annual mee

Proceedings : microscopy and microanalysis 2002 : Microscopy Society of America, 60th annual meeting, Microbeam analysis Society, 36th annual meeting, Microscopy Society of Canada, 29th annual meeting, International Metallographic Society, 35th annual mee
Catalogue Information
Field name Details
Dewey Class 57.08
Title Proceedings : microscopy and microanalysis 2002 : Microscopy Society of America, 60th annual meeting, Microbeam analysis Society, 36th annual meeting, Microscopy Society of Canada, 29th annual meeting, International Metallographic Society, 35th annual mee / edited by E. Voelkl ... [et al.]
(M)
Added Personal Name Voelkl, Edgar
Other name(s) Microscopy Society of America
Microscopy Society of Canada
Microbeam Analysis Society
International Metallographic Society
Publication Cambridge : Cambridge University Press , c2002
Physical Details lxiii, 480 p. : ill. ; 25 cm. + 1 CD-ROM
Series Microscopy and microanalysis ; v.8 Suppl. n.2
ISBN 0-521-82405-2
Note For the CD-ROM please ask librarians in the office
Links to Related Works
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Catalogue Information 11804 Beginning of record . Catalogue Information 11804 Top of page .
Item Information
Barcode Shelf Location Collection Volume Ref. Branch Status Due Date
00000000257758 57.08 MIC 2002
General   SISSA . . Available .  
00000000257865 57.08 MIC 2002 (CD-ROM : Library Office/Ufficio Biblioteca (CD-ROM)
General   SISSA . . Available .  
. Catalogue Record 11804 ItemInfo Beginning of record . Catalogue Record 11804 ItemInfo Top of page .

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