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Proceedings : microscopy and microanalysis 2002 : Microscopy Society of America, 60th annual meeting, Microbeam analysis Society, 36th annual meeting, Microscopy Society of Canada, 29th annual meeting, International Metallographic Society, 35th annual mee
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Catalogue Record 11804
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Catalogue Information
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Details
Dewey Class
57.08
Title
Proceedings : microscopy and microanalysis 2002 : Microscopy Society of America, 60th annual meeting, Microbeam analysis Society, 36th annual meeting, Microscopy Society of Canada, 29th annual meeting, International Metallographic Society, 35th annual mee / edited by E. Voelkl ... [et al.]
(M)
Added Personal Name
Voelkl, Edgar
Other name(s)
Microscopy Society of America
Microscopy Society of Canada
Microbeam Analysis Society
International Metallographic Society
Publication
Cambridge : Cambridge University Press , c2002
Physical Details
lxiii, 480 p. : ill. ; 25 cm. + 1 CD-ROM
Series
Microscopy and microanalysis
; v.8 Suppl. n.2
ISBN
0-521-82405-2
Note
For the CD-ROM please ask librarians in the office
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Subject References:
Microscopy
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Authors:
Voelkl, Edgar
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Corporate Authors:
International Metallographic Society
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Microbeam Analysis Society
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Microscopy Society of America
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Microscopy Society of Canada
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Series:
Microscopy and microanalysis
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Classification:
57.08
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57.08 MIC 2002
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00000000257758
57.08 MIC 2002
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00000000257865
57.08 MIC 2002 (CD-ROM : Library Office/Ufficio Biblioteca (CD-ROM)
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