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Secondary ion mass spectrometry: SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983

Secondary ion mass spectrometry: SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
Catalogue Information
Field name Details
Dewey Class 543.087305 (DDC 19)
Title Secondary ion mass spectrometry: SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / / editors: A. Benninghoven ... [et al.].
(M)
Added Personal Name Benninghoven, A.
Other name(s) Nihon Gakujutsu Shinkåokai
Publication Berlin : Springer-Verlag , 1984
Physical Details xv, 503 p. : ill. ; 24 cm.
Series Springer Series in chemical physics ; 36
ISBN 038713316X
Note Includes bibliographies and index.
Links to Related Works
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Catalogue Information 13149 Beginning of record . Catalogue Information 13149 Top of page .
Item Information
Barcode Shelf Location Collection Volume Ref. Branch Status Due Date
00000000064097 538.971 SEC 1983
General   SISSA . . Available .  
. Catalogue Record 13149 ItemInfo Beginning of record . Catalogue Record 13149 ItemInfo Top of page .

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