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Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
Catalogue Information
Field name Details
Dewey Class 502.825 (DDC 22)
Title Scanning Probe Microscopy (EB) : Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman.
Author Kalinin, Sergei
Added Personal Name Gruverman, Alexei
Other name(s) SpringerLink (Online service)
Publication New York, NY : Springer Science+Business Media, LLC , 2007.
Physical Details : v.: digital
ISBN 9780387286686
System details note Online access to this digital book is restricted to subscription institutions through IP address (only for SISSA internal users)
Internet Site http://dx.doi.org/10.1007/978-0-387-28668-6
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Catalogue Information 21968 Beginning of record . Catalogue Information 21968 Top of page .

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