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Feldname	Details
Dewey Class	621.3 (DDC 22)
Titel	Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices (EB) / edited by Josef Sikula, Michael Levinshtein.
Added Personal Name	Levinshtein, Michael
Added Personal Name	Sikula, Josef
Other name(s)	SpringerLink (Online service)
Veröffentl	Dordrecht : Springer , 2005.
Physical Details	: v.: digital
Reihe	NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry 1568-2609 ; 151
ISBN	9781402021701
System details note	Online access to this digital book is restricted to subscription institutions through IP address (only for SISSA internal users)
Internet Site	http://dx.doi.org/10.1007/1-4020-2170-4
LINKS ZU 'VERWANDTEN WERKEN	Schlagwörter: . Computer engineering . Electronic and Computer Engineering . Measurement Science, Instrumentation . Optical and Electronic Materials . Optical materials . Physics . Weights and measures . Authors: Levinshtein, Michael . Sikula, Josef . Corporate Authors: SpringerLink (Online service) . Series: NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry . Classification: 621.3 (DDC 22) .

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