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Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Catalogue Information
Nome campo dettagli
Dewey Class 621.3 (DDC 22)
Titolo Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices (EB) / edited by Josef Sikula, Michael Levinshtein.
Added Personal Name Levinshtein, Michael
Sikula, Josef
Other name(s) SpringerLink (Online service)
Pubblicazione Dordrecht : Springer , 2005.
Physical Details : v.: digital
Serie NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry 1568-2609 ; 151
ISBN 9781402021701
System details note Online access to this digital book is restricted to subscription institutions through IP address (only for SISSA internal users)
Internet Site http://dx.doi.org/10.1007/1-4020-2170-4
Link alle Opere Legate
  • Riferimenti soggetto: .
  • Computer engineering .
  • Electronic and Computer Engineering .
  • Measurement Science, Instrumentation .
  • Optical and Electronic Materials .
  • Optical materials .
  • Physics .
  • Weights and measures .

  • Authors:
    Corporate Authors:
    Series:
    Classification:
    Catalogue Information 22540 Beginning of record . Catalogue Information 22540 Top of page .

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